Phone : +91-3222-283292
Location : NB / GF / 14, CRF

Professor-In-Charge
Prof. Rahul Mitra
Department of Metallurgical & Materials engineering
rahul@metal.iitkgp.ernet.in
+91-3222-283292Prof. Rathindranath Maiti
Department of Metallurgical & Materials engineering
rmaiti@mech.iitkgp.ernet.in
+91-3222-282938

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Objectives

Examination of microstructures of surfaces and interphase interfaces

Analysis of chemical compositions of selected phases and determination of composition gradient




People


Prof. Rahul Mitra
Professors-In-Charge
Department of Metallurgical & Materials engineering
rahul@metal.iitkgp.ernet.in
+91-3222-283292
Prof. Rathindranath Maiti
Professors-In-Charge
Department of Metallurgical & Materials engineering
rmaiti@mech.iitkgp.ernet.in
+91-3222-282938

Equipments


Analytical Scanning Electron Microscope (A-SEM).

Specification of the Instrument:
(1) ZEISS EVO 60 Scanning Electron Microscope with Oxford EDS Detector. The Microscope works with tungsten filament and maximum acceleration voltage of 30 kV. 
(2) Sputter Coater of Gold-Palladium target, Model: POLARON-SC7620,Carbon Accessory, Model-CA76

Facilities: 
(1) Secondary Electron Detector (SE), 
(2)Backscattered Electron Detector (BSD)
(3) Energy Dispersive X-ray Spectroscopy (EDS): for 

 •Qualitative Microanalysis,
 •Quantitative Microanalysis,
 •X-ray Area Mapping,
 •Line Scanning 

(4) Wavelength Dispersive X-ray Spectroscopy (WDS): for
      •Qualitative Microanalysis, 
      •Quantitative Microanalysis
(5) Electron Backscattered Diffraction (EBSD)
(6) Variable Pressure Secondary Electron (VPSE) mode

Manufacturer's details: 
SEM: Carl ZEISS SMT, Germany
EDS & WDX: INCA PentaFET x3, Oxford Instrument UK.
EBSD : Nordlys HKL Technology, UK
Sputter coater: POLARON, UK

Purchase source (funding): MHRD

Year of installation: Sept 2008

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