ZEISS Scanning Electron Microscope Laboratory (EVO 60)

Phone : +91-3222-283292

Location : NB / GF / 14, CRF

Facilitator : Dr. Sujoy Kanti Ghosh, Geology and Geophysics
Email: sujoy.ghosh@gg.iitkgp.ac.in, Contact:+91-3222-283364


Scanning Electron Microscope examines the microstructure images and composition analysis (EDS) of surfaces and interphase interfaces of small and of dry specimens.


Dr. Sujoy Kanti Ghosh
Geology and Geophysics

Equipment Details

Analytical Scanning Electron Microscope (A-SEM).

ZEISS EVO 60 Scanning Electron Microscope with Oxford EDS Detector. The Microscope works with tungsten filament and maximum acceleration voltage of 30 kV.

(1) Secondary Electron Detector (SE), 
(2)Backscattered Electron Detector (BSD)
(3) Energy Dispersive X-ray Spectroscopy (EDS): for 
  •Qualitative Microanalysis,
  •Quantitative Microanalysis,
  •X-ray Area Mapping,
  •Line Scanning 
(4) Wavelength Dispersive X-ray Spectroscopy (WDS): for
      •Qualitative Microanalysis, 
      •Quantitative Microanalysis
(5) Electron Backscattered Diffraction (EBSD)
(6) Variable Pressure Secondary Electron (VPSE) mode

Manufacturer's details: 
SEM: Carl ZEISS SMT, Germany
EDS & WDX: INCA PentaFET x3, Oxford Instrument UK.
EBSD : Nordlys HKL Technology, UK
Sputter coater: POLARON, UK

Purchase source (funding): MHRD

Year of installation: Sept 2008

Utility and Working Principal

Sample Details

The samples should be clean, dry, small piece of solid or powder.

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